Materials Research Facility

Nanoindenter

Agilent Nanoindenter G200

Features and benefits

  • Accurate, repeatable results compliant with ISO 14577 standard
  • Electromagnetic actuation allows unparalleled dynamic range in force and displacement
  • Configurable for routine testing or new applications
  • Real-time experimental control, easy test protocol development, and precision drift
  • compensation

High load

  • Maximum force 10N
  • Load resolution =1mN
  • Maximum indentation depth =500µm
  • Displacement resolution 0.01nm

Continuous Stiffness Measurement (CSM)

CSM option offers a means of separating the in-phase and out-of-phase components of the load-displacement history. This separation provides an accurate measurement of the location of initial surface contact and continuous measurement of contact stiffness as a function of depth or frequency, thus eliminating the need for unloading cycles.

NanoindenterStage
- Useable surface area 100mm x 100mm
- Automated position control remote with mouse
- Positioning accuracy 1µm
 
NanoVision Stage
- Used for contact atomic force microscopy
- X-Y scan range 100µm x 100µm
- Positioning accuracy =nm
- Resonant frequency >120Hz
 
 XP Indentation Head
- Displacement measurement via capacitance gauge
- Displacement resolution <0.01nm
- Loading capability: =500mN or =10N in high load (see above)
- Contact force <1.0µN
- Load frame stiffness ~5MN/m
 
Optical Microscope
- Objectives 10x and 40x
- Video screen 25x (x objective mag.)